Sangbu Yoon, a student in the Integrated Program at POSTECH’s Department of Electrical Engineering (advisor: Prof. Youngju Lee), received the Best Design Award at the Semiconductor Design Education Center (IDEC) Congress Chip Design Contest (CDC).

IDEC supports system semiconductor design infrastructure at domestic universities and hosts the largest CDC event in the country every year. The 2024 IDEC Congress, held at KAIST on July 9, saw over 70 submissions. Sangbu Yoon’s design, titled “High-throughput and scalable deep learning-driven massive MIMO detector in 28nm CMOS technology,” received the highest evaluation and was awarded the Best Design Award.

In his design, Yoon implemented the world’s first deep learning-based massive MIMO detector, proposing optimization techniques that significantly improve both the transmission speed and power efficiency, while offering superior algorithm performance compared to previous research.